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956d9a05e6
These declarations either aren't used or aren't needed, as testBase.h already declares them. Some definitions got moved to test_common.h, as these are duplicated across few files. There's further opportunity to improve code reuse via test_common.h, but that's for future patch. Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
17 lines
513 B
C
17 lines
513 B
C
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#include "../testBase.h"
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#define ABS_ERROR(result, expected) (fabs(expected - result))
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#define CLAMP(_val, _min, _max) \
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((_val) < (_min) ? (_min) : (_val) > (_max) ? (_max) : (_val))
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#define MAX_ERR 0.005f
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#define MAX_TRIES 1
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#define MAX_CLAMPED 1
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extern cl_sampler create_sampler(cl_context context, image_sampler_data *sdata, bool test_mipmaps, cl_int *error);
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extern bool gExtraValidateInfo;
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extern bool gDisableOffsets;
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extern bool gUseKernelSamplers;
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