* Use std::vector for format lists in images suite
Avoids memory deallocation issues and generally simplifies the code.
* Fixup formatting with git-clang-format
Pass the right flags to the tests that create images to ensure valid
usage.
Fixes issue #330
Signed-off-by: James Morrissey <james.morrissey@arm.com>
Co-authored-by: Alessandro Navone <alessandro.navone@arm.com>
* Enable -Werror for GCC/Clang builds
Fixes many of the errors this produces, and disables a handful that
didn't have solutions that were obvious (to me).
* Check for `-W*` flags empirically
* Remove cl_APPLE_fp64_basic_ops support
* Undo NAN conversion fix
* Add comments to warning override flags
* Remove unneeded STRINGIFY definition
* Fix tautological compare issue in basic
* Use ABS_ERROR macro in image tests
* Use fabs for ABS_ERROR macro
* Move ABS_ERROR definition to common header
This moves the filter_formats and get_format_list functions to a common
file. These functions were roughly the same, with an optional filtering
in some tests for testing mipmaps.
Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
Removing all references to check_opencl_version as similar
get_device_cl_version() can be used instead.
Fixes#527
Change-Id: I474b6f536033707e1beb9b5b39410de24672c040
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
This removes all the duplicated code from each test, and moves it to
test harness so that we have single place where this information is
printed.
Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
Some of the setup functionality is already there in the test harness, so
use that and remove the duplicated code from within the suite.
Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
