* Use std::vector for format lists in images suite
Avoids memory deallocation issues and generally simplifies the code.
* Fixup formatting with git-clang-format
These declarations either aren't used or aren't needed, as testBase.h
already declares them.
Some definitions got moved to test_common.h, as these are duplicated
across few files. There's further opportunity to improve code reuse
via test_common.h, but that's for future patch.
Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
* skip test cases rather than fail without cl_khr_3d_image_writes
cl_khr_3d_image_writes is required for OpenCL 2.x devices, but is not
required for OpenCL 1.x or OpenCL 3.0 devices. A check for the presence
of the extension on OpenCL 2.x devices already exists in
test_min_max_device_version, so we don't need any failure conditions
here, and can just skip tests if the extension is not supported.
* clang-format changes
This moves the filter_formats and get_format_list functions to a common
file. These functions were roughly the same, with an optional filtering
in some tests for testing mipmaps.
Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
Removing all references to check_opencl_version as similar
get_device_cl_version() can be used instead.
Fixes#527
Change-Id: I474b6f536033707e1beb9b5b39410de24672c040
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
This removes all the duplicated code from each test, and moves it to
test harness so that we have single place where this information is
printed.
Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
Some of the setup functionality is already there in the test harness, so
use that and remove the duplicated code from within the suite.
Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
