TEST_SKIPPED_ITSELF was originally located in
threadTesting.h but this no longer makes sense.
This change moves the definition to the test_status
struct in testHarness so that it can be used in the same
way that test_status' can be used.
Signed-off-by: Chetankumar Mistry <chetan.mistry@arm.com>
* Tests requiring image support use runTestHarnessWithCheck
Removing special case for images in runTestHarness.
Fixes#710
* Remove imageSupportRequired argument
Tests which require image support now specify this while
calling runTestHarnessWithCheck.
Fixes#710
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
* Reimplement buffer tests
Reintegrated and fixed test code for buffer tests buffer_read_half and
buffer_write_half tests.
Added mem_alloc_ref_flags test code, as was previously non-existent,
to test CL_MEM_ALLOC_HOST_PTR. This flag was otherwise untested and
as similar tests within the suite are used to test other cl_mem_flags
it has been assumed that this was the purpose of the test.
Fixes#439
Change-Id: I5accf986be7436d09377d0bfd7afd5de2235c329
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
* move mem_read_write_flags to a common function
Code under mem_*_flags tests have a lot of duplication, this is
the first step of moving test code to a common function.
Contributes #439
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
* move mem_write_only_flags test code to a common function
Code under mem_*_flags tests have a lot of duplication
Contributes #439
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
* move mem_read_only_flags test code to a common function
Code under mem_*_flags tests have a lot of duplication
Contributes #439
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
* move mem_copy_host_flags test code to a common function
Code under mem_*_flags tests have a lot of duplication, moved
mem_copy_host_flags code and rearranged function where appropriate
mem_ref_alloc_flags test also uses common function.
Contributes #439
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
* Remove unused NOT_IMPLEMENTED_TEST macro
This define is not in use anymore, since tests have been
reimplemented in #439. Tests should be working and implemented
or not registered.
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
* Reformat common help text
Signed-off-by: Stuart Brady <stuart.brady@arm.com>
* Reformat test harness code
This goes part of the way to fixing issue #625.
Signed-off-by: Stuart Brady <stuart.brady@arm.com>
When running sub-tests explicitly on the command line and that sub-test
fails, the test harness returns `0` from `main()`. This is problematic
in automated testing environments as failed tests can be hidden.
This patch iterates over all the test results in the `resultTestList`
after all sub-tests have completed, if any of the tests failed a
non-zero value is returned from `parseAndCallCommandLineTests()` which
is then propagated up the call stack to `main()`.
- Remove the requirement to detail values for device queries and list
extensions in the submission template. They are printed by computeinfo.
- Require that tests skipped in accordance with the conformance
process be listed in the submission template.
- Remove support for OPENCL_1_0_DEVICE. This variable doesn't control
anything anymore and the updated conformance process no longer refers
to it.
- Require that implementations running via a loader document the loader
that was used.
Signed-off-by: Kevin Petit <kevin.petit@arm.com>
* Accept OpenCL 3.0 in version parsing code and use where appropriate
There were a number of tests against 2.2 that are clearer against 3.0.
Fixes#751
Signed-off-by: Kévin Petit <kpet@free.fr>
* Remove CL_EXPERIMENTAL guards
Signed-off-by: Kévin Petit <kpet@free.fr>
* formatting
* Configure the headers for OpenCL 3.0
* more format fixes
(Patch1)
A number of tests have got their own code for checking the presence of
extensions. This change replaces that code with is_extension_available
function.
Contributes to #627
Change-Id: I8dd2233719aa8c84841ac61776437d7f6e3fafe6
Signed-off-by: Ellen Norris-Thompson <ellen.norris-thompson@arm.com>
* Harness: Added an option for a test to skip itself.
New condtion in callSingleTestFunction. This allows a test to return TEST_SKIP if the device does not support the requested test.
* Split generic_ptr_to_host_mem into two tests.
The old generic_ptr_to_host_mem test tests two different device capabilities (SVM and not SVM). This is a prerequisite for the following commit.
* Generic Address Space: Skip tests utlilising SVM on devices that do not support SVM.
Where a device does not support SVM, do not run the generic address space test(s) that rely on SVM.
Add gDeviceType set on kernel_read_write tests(image_streams)
as the device type affects the way validation is performed in the test.
Signed-off-by: John Kesapides <john.kesapides@arm.com>
Moved all duplicate 'PrintArch' functions to testHarness.c
Replaced sysctl system call used in 'PrintArch' function with uname
system call
Signed-off-by: bhargavdas <bhargav_das@mentor.com>
Update testHarness.c
