mirror of
https://github.com/KhronosGroup/OpenCL-CTS.git
synced 2026-03-24 07:59:01 +00:00
cl22: Reuse test harness code in kernel_read_write (#243)
Some of the setup functionality is already there in the test harness, so use that and remove the duplicated code from within the suite. Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>
This commit is contained in:
committed by
Kévin Petit
parent
97c11cff1d
commit
f635b604f7
@@ -58,16 +58,16 @@ enum TestTypes
|
||||
kAllTests = ( kReadTests | kWriteTests | kReadWriteTests )
|
||||
};
|
||||
|
||||
typedef int (*test_format_set_fn)( cl_device_id device,
|
||||
typedef int (*test_format_set_fn)( cl_device_id device, cl_context context, cl_command_queue queue,
|
||||
cl_image_format *formatList, bool *filterFlags, unsigned int numFormats,
|
||||
image_sampler_data *imageSampler, ExplicitType outputType,
|
||||
cl_mem_object_type imageType );
|
||||
|
||||
extern int test_read_image_formats( cl_device_id device,
|
||||
extern int test_read_image_formats( cl_device_id device, cl_context context, cl_command_queue queue,
|
||||
cl_image_format *formatList, bool *filterFlags, unsigned int numFormats,
|
||||
image_sampler_data *imageSampler, ExplicitType outputType,
|
||||
cl_mem_object_type imageType );
|
||||
extern int test_write_image_formats( cl_device_id device,
|
||||
extern int test_write_image_formats( cl_device_id device, cl_context context, cl_command_queue queue,
|
||||
cl_image_format *formatList, bool *filterFlags, unsigned int numFormats,
|
||||
image_sampler_data *imageSampler, ExplicitType outputType,
|
||||
cl_mem_object_type imageType );
|
||||
|
||||
Reference in New Issue
Block a user