Remove unused code in kernel_read_write (#1050)

These declarations either aren't used or aren't needed, as testBase.h
already declares them.

Some definitions got moved to test_common.h, as these are duplicated
across few files. There's further opportunity to improve code reuse
via test_common.h, but that's for future patch.

Signed-off-by: Radek Szymanski <radek.szymanski@arm.com>

test_conformance/images/kernel_read_write/main.cpp

@@ -13,22 +13,14 @@
 // See the License for the specific language governing permissions and
 // limitations under the License.
 //
-#include "../harness/compat.h"
 
 #include <stdio.h>
 #include <string.h>
-
-#if !defined(_WIN32)
-#include <unistd.h>
-#include <sys/time.h>
-#endif
-
 #include "../testBase.h"
+#include "../harness/compat.h"
 #include "../harness/fpcontrol.h"
 #include "../harness/parseParameters.h"
 
-#include <vector>
-
 #if defined(__PPC__)
 // Global varaiable used to hold the FPU control register state. The FPSCR register can not
 // be used because not all Power implementations retain or observed the NI (non-IEEE
@@ -58,8 +50,6 @@ bool            gEnablePitch = false;
 int             gtestTypesToRun = 0;
 static int testTypesToRun;
 
-#define MAX_ALLOWED_STD_DEVIATION_IN_MB        8.0
-
 static void printUsage( const char *execName );
 
 extern int test_image_set( cl_device_id device, cl_context context, cl_command_queue queue, test_format_set_fn formatTestFn, cl_mem_object_type imageType );